Microstructure and Structual Change of Magnetoelectric and Piezotronic Sensors
The combination of high resolution synchrotron-based X-ray scattering techniques and advanced transmission electron microscopy methods provides a unique view of the structural behavior of model sensors in situ and in operando. The synergetic combination covers a broad range of length scales, thus, enabling to investigate the local strain from the atomic to the µm dimensions. Here we plan to examine model sensors and their components, particularly as developed in projects A1 and A5 in identical and complimentary geometries allowing us to visualize strain and defect behavior in detail. These results will be returned to the project partners to ensure a knowledge-based enhancement of the sensor performance.